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IDProjectCategoryView StatusLast Update
0001469K18X001.00 SKB SWANHWpublic2025-04-11 21:33
Reporter(HW) Tom Lee Assigned To(ALTech) SH Son Due Date
PrioritynormalSeveritys3-moderateReproducibilityhave not tried
Status closedResolutionfixed 
Summary0001469: There seems to be a quality difference issue between MP adaptors.
DescriptionFii test conduction for 2nd build sample of 2nd source, found SWAN + sample NO.0 MP adaptor is fail, SWAN + sample No.1 and No.2 MP adaptors are pass.
There seems to be a quality difference issue between MP adaptors.
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(HW) Tom Lee

2022-04-28 11:33

developer  

(ALTech) SH Son

2022-04-28 11:56

developer   ~0009943

Hi Tom

Could you please send the No.0 adaptor?
I will request the analyze to the adaptor vender.

Thanks
SON

(HW) Tom Lee

2022-04-28 16:05

developer   ~0009945

Hi, SH
No problem.
Please provide ALT's FedEx account to me.

Thanks ~
Tom

(HW) Sean Chiang

2022-05-04 12:54

developer   ~0009961

Hi Mr.Yoon,

As mentioned in the weekly meeting last Friday, the failed CE may be an risk for current MP product.
I think we should clarify the root cause of the defective PSU found in our side.
Have you informed the supplier about this? We are waiting for your confirmation & FedEX account to send back the defective unit.


Thanks,
Regards,
Sean

(ALTech) Lonnie Kim

2022-05-04 13:09

developer   ~0009963

Hi, Sean

I have question about CE fail.
Do you means EMC CE or CE certification?
If CE certification, that daptor dpn't need to CE test.
Why did you test CE?

Best regards

Lonnie Kim

(HW) Sean Chiang

2022-05-04 13:38

developer   ~0009964

Hi Lonnie,

I mean EMC Conduction Emission test.

Regards,
Sean

(ALTech) Sun Choul Joung

2022-06-24 08:40

developer   ~0010240

Last edited: 2022-06-24 08:51

Hi Tom

The adapter ce conduction test failed.
We requested 8D report to adapter vendor

Regards
Joung

(ALTech) Sun Choul Joung

2022-08-19 16:10

developer   ~0010667

Hi Tom

The update of test result of root cause to conduction issue from adapter vendor up to now

Regards
joung

(ALTech) Sun Choul Joung

2022-09-20 07:55

developer   ~0010896

Last edited: 2022-09-20 07:56

Hi Tom

The update of test result of 10EA Sample production by production plant.

Regards.
Joung

(ALTech) Sun Choul Joung

2022-09-20 07:59

developer   ~0010897

Hi Tom

The update of test result of 10EA Sample production by production plant.

Regards.

Joung

(ALTech) Sun Choul Joung

2022-10-28 08:08

developer   ~0011124

Hi Tom

Efficacy evaluation test results of updated report attached .

Regards

joung

(HW) Tom Lee

2022-10-28 19:06

developer   ~0011131

Hi, Joung

reply 0001469:0011124
The file was corruption, lack of page 18 / 20 / 21.
Please re-upload the file.

Thanks !
Tom

(ALTech) Sun Choul Joung

2022-10-31 10:06

developer   ~0011133

Hi Tom

The EMI fail report is re-upload .

Regards

joung

(HW) Sean Chiang

2025-04-11 21:33

developer   ~0017482

No more action. So, close this issue.

Issue History

Date Modified Username Field Change
2022-04-28 11:33 (HW) Tom Lee New Issue
2022-04-28 11:33 (HW) Tom Lee Status new => assigned
2022-04-28 11:33 (HW) Tom Lee Assigned To => (ALTech) SH Son
2022-04-28 11:33 (HW) Tom Lee File Added: BFX-UA300 2nd build sample conduction test result.pdf
2022-04-28 11:37 (HW) Tom Lee Issue Monitored: (HW) Tom Lee
2022-04-28 11:37 (HW) Tom Lee Severity s2-severe => s3-moderate
2022-04-28 11:37 (HW) Tom Lee Description Updated
2022-04-28 11:38 (HW) Tom Lee Issue Monitored: (HW) Sean Chiang
2022-04-28 11:40 (HW) Tom Lee Issue Monitored: (ALTech) Lonnie Kim
2022-04-28 11:40 (HW) Tom Lee Issue Monitored: (ALTech) SY Yoon
2022-04-28 11:56 (ALTech) SH Son Note Added: 0009943
2022-04-28 16:05 (HW) Tom Lee Note Added: 0009945
2022-05-04 12:54 (HW) Sean Chiang Note Added: 0009961
2022-05-04 13:09 (ALTech) Lonnie Kim Note Added: 0009963
2022-05-04 13:38 (HW) Sean Chiang Note Added: 0009964
2022-06-24 08:40 (ALTech) Sun Choul Joung File Added: adapter ce fail conduction test.pdf
2022-06-24 08:40 (ALTech) Sun Choul Joung Note Added: 0010240
2022-06-24 08:51 (ALTech) SY Yoon Note Edited: 0010240
2022-08-19 16:10 (ALTech) Sun Choul Joung Note Added: 0010667
2022-08-19 16:10 (ALTech) Sun Choul Joung File Added: LA-B271KS ADAPTOR(24V 4A) EMI fail report_220819.pptx
2022-09-20 07:55 (ALTech) Sun Choul Joung Note Added: 0010896
2022-09-20 07:56 (ALTech) Sun Choul Joung Note Edited: 0010896
2022-09-20 07:59 (ALTech) Sun Choul Joung Note Added: 0010897
2022-09-20 07:59 (ALTech) Sun Choul Joung File Added: LA-B271KS ADAPTOR(24V 4A) EMI fail report_2200920.pptx
2022-09-20 08:28 (ALTech) Sun Choul Joung Note View State: 0010896: private
2022-09-20 08:29 (ALTech) Sun Choul Joung Note View State: 0010896: public
2022-10-28 08:08 (ALTech) Sun Choul Joung Note Added: 0011124
2022-10-28 08:08 (ALTech) Sun Choul Joung File Added: LA-B271KS ADAPTOR(24V 4A) EMI fail report_221027.pptx
2022-10-28 19:06 (HW) Tom Lee Note Added: 0011131
2022-10-31 10:06 (ALTech) Sun Choul Joung Note Added: 0011133
2022-10-31 10:06 (ALTech) Sun Choul Joung File Added: LA-B271KS ADAPTOR(24V 4A) EMI fail report_221027.pdf
2022-10-31 10:06 (ALTech) Sun Choul Joung File Added: Efficacy evaluation EMI TEST results.xlsx
2022-10-31 10:06 (ALTech) Sun Choul Joung File Added: EMI TEST DATA (220915).zip
2025-04-11 21:33 (HW) Sean Chiang Status assigned => closed
2025-04-11 21:33 (HW) Sean Chiang Resolution open => fixed
2025-04-11 21:33 (HW) Sean Chiang Note Added: 0017482